D. Mendeleev University of Chemical Technology of Russia, Moscow, Russia

А. D. Zaitseva, Postgraduate Student of the Department of Industrial Ecology, e-mail: zaicevaaleksandra95@gmail.com
Е. N. Кuzin, Head of the Department of Industrial Ecology, Doctor of Technical Sciences, Associate Professor, e-mail: Kuzin.e.n@muctr.ru

Given the complex geopolitical situation and the emerging technological sovereignty of the Russian Federation, the development and implementation of new methods and technologies for the extraction of rare earth metals is becoming a strategically important task. Extraction and processing require constant monitoring of the composition of technological solutions. In view of this, there is the need to implement appropriate import-substituting equipment. The possibility of controlling the chemical composition of technological solutions of the process of diopside sulfuric acid processing to obtain scandium concentrate is studied. A set of analytical techniques has been developed for an import-substituted atomic emission spectrometer with microwave-coupled plasma (Spectroscai, Skygrad Group of Companies, Russia) in order to determine the content of scandium compounds and impurities of aluminum, titanium, iron, calcium and magnesium in technological highly mineralized solutions. The ranges of the content of Sc and impurity elements in the composition of calibration and technological solutions for diopside processing, as well as the detection limit of the target component (scandium), are given. Analytical lines have been selected and tested to identify each element. The combined use of atomic and ion lines avoids measurement errors associated with overlapping spectra of different metals. Calibration graphs with a high degree of approximation are constructed, confirming the linear dependence of the radiation intensity on the concentration of metals, regardless of the content of impurity elements. It is proved that the use of the Spectroscai device in comparison with its foreign counterpart can significantly reduce measurement error by minimizing dilution, as well as reduce the cost of consumables by using gases of technical and chemical purity, which proves the promising outlook of the method of atomic emission analysis with microwave-coupled plasma in the control of technological solutions for diopside processing.

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