SURFACE STRUCTURE OF SILICON/CARBON MATRIX NANOCOMPOSITES AS REVEALED BY SCANNING PROBE MICROSCOPY

Скрыть↑

NANOMATERIALS AND NANOTECHNOLOGY
Название	SURFACE STRUCTURE OF SILICON/CARBON MATRIX NANOCOMPOSITES AS REVEALED BY SCANNING PROBE MICROSCOPY
Автор	M.D. Malinkovich, Yu.N. Parkhomenko, D.S. Polyakov and M.L. Shupegin
Информация об авторе	M.D. Malinkovich, Yu.N. Parkhomenko, D.S. Polyakov and M.L. Shupegin, Federal State Educational Institution for Higher Professional Education ‘National University of Science and Technology “MISiS”’
Реферат	The surface of silicon/carbon matrix amorphous films containing nanosized platinum particles has been studied by scanning probe microscopy. The film surface as imaged by atomic force microscopy has random roughness sized less than 1 nm whereas the surface image obtained by scanning tunneling microscopy shows densely packed hemispheric features several decades of nanometers in diameter and several nanometers in height. We assume that platinum particles are distributed regularly during film synthesis.
Ключевые слова	Silicon/carbon matrix, AFM image, STM image, nanometer size particles.
Language of full-text	русский
Полный текст статьи	Получить